The Laboratory for Surface Analysis and Corrosion Science is a state-of-the-art
analytical facility containing three electron spectrometers, all having
variable angle X-ray Photoelectron Spectroscopy (XPS) capabilities
and two equipped to perform sub-micron spot Auger Electron Spectroscopy
and chemical mapping. In addition, the Laboratory contains two custom
designed static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
systems. The static SIMS uses a Ga metal ion gun with a spot size
of 0.2 microns to allow chemical mapping of surfaces with a detection
level approaching the ppm range for many species. A recently acquired
multiple technique UHV system integrates variable angle XPS, Auger
mapping and profiling and static SIMS with a high ion beam current
duoplasmatron ion gun source. Vibrational and optical spectroscopy
equipment available includes a Nicolet 760 FTIR spectrometer for mid
and far range infrared analysis with multiple sampling accessories
for surface and diffuse reflectance, and is equipped with a state-of-the-art
Continuum IR microscope. The microscope is equipped with optics for
diffuse reflectance microspectroscopy, diamond crystal ATR microspectroscopy,
and a unique grazing angle objective for thin film analysis. This
complements synchrotron-based FTIR microspectroscopy performed by
this laboratory at the National Synchrotron Light Source at BNL on
a variety of metallic, polymeric and organo-metallic surfaces. Additional
optical equipment includes a custom-designed laser confocal microscopy
and topographic mapping system capable of analyzing large area samples
(up to several inches in diameter) with associated image processing
software. Other software developed in this laboratory is available
for laser speckle interferometry that allows for detection of small
changes in surface features or their positions, which can be displayed
as a vector map of the surface. The laboratory is also equipped with
a UV-vis spectrometer system for liquid or reflection measurements.
A high sensitivity atomic absorption spectrometer has recently been
purchased which will be equipped with a graphite furnace for enhanced
elemental sensitivity. Shipley-Ronal Corporation has recently donated
a Cambridge Stereoscan 260 SEM to the laboratory. Overall, this combination
of advanced analytical XPS/Auger/SIMS/Infrared/optical facilities
allow for state-of-the-art surface characterization and chemical mapping.
Other equipment associated with this laboratory includes an ultra
high vacuum fabrication chamber configured with two saddle-field ion
guns for novel thin film fabrication through Ion Beam Assisted Deposition
(IBAD) and a prototype high vacuum chamber for femtosecond Ti-sapphire
laser ablation for film deposition and profiling for chemical analysis.
A DURIP (Defense University Research Instrumentation Program) proposal
was recently awarded to build a high precision materials synthesis
and analysis vacuum apparatus which will enable state-of-the-art control
for both micro-machining and inspection as well as thin film synthesis
when interfaced to the proposed femtosecond laser.
Our electrochemical analysis facility includes three potentiostats
capable of nA range current measurement with PC-based computer control
and data acquisition and analysis systems, and electrochemical impedance
and noise analysis systems. Several controlled atmosphere glove boxes
are also available to allow for sample preparation and transfer to
the spectrometer facilities without risk of environmental contamination
or atmospheric surface reaction.